- Title
- Effects of electrical stressing on microstructure and thermoelectric properties of bismuth telluride compounds
- Creators - without role
- Y. H. ChenC. N. Liao - 國立清華大學工學院材料科學工程學系H. S. Chu
- Publication Details
- TMS 144th Annual Meeting & Exhibition
- Identifiers
- 9957772825206774
- Academic Unit
- Department of Materials Science and Engineering, College of Engineering, National Tsing Hua University
- Language
- Traditional Chinese
- Resource Type
- Conference paper
Conference paper
Effects of electrical stressing on microstructure and thermoelectric properties of bismuth telluride compounds
TMS 144th Annual Meeting & Exhibition
2015
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