Abstract
Image alignment is the most crucial problem in industrial visual inspection. Traditional intensity-matching based methods, including the normalized correlation method, are not robust against non-uniform illumination variations. In this paper, we present a generalized intensity-based matching approach to accomplish accurate and robust image alignment under high-level noises and large non-uniform illumination variations. This generalization is an extension of our previous FLASH (Fast Localization with Advanced Search Hierarchy) algorithm for image alignment.