Logo image
Exciton Diffusion Length Measurement by External Quantum Efficiency Spectra Modeling
Conference paper

Exciton Diffusion Length Measurement by External Quantum Efficiency Spectra Modeling

C.-W. Chen, Y.-T. Lin, W.-C. Huang and H.-W. Lin
Asian Conference on Organic Electronics& Asian Symposium on Organic Materials for Electronics and Photonics Asian Conference on Organic Electronics& Asian Symposium on Organic Materials for Electronics and Photonics
2010

Metrics

1 Record Views

Details

Logo image