Extracting the complex optical conductivity of true twodimensional layers by ellipsometry

You-Chia Chang; Chang-Hua Liu; Zhaohui Zhong; Theodore B. Norris

doi:10.1364/cleo_si.2014.sm3h.2

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Conference paper

Extracting the complex optical conductivity of true twodimensional layers by ellipsometry

You-Chia Chang, Chang-Hua Liu, Zhaohui Zhong and Theodore B. Norris

Optics InfoBase Conference Papers

2014

DOI: https://doi.org/10.1364/cleo_si.2014.sm3h.2

Appears in keyword about Physics

Abstract

Instrumentation

Atomic and Molecular Physics

and Optics

A simple and robust technique to extract the complex optical conductivity of truly twodimensional materials is developed. Applying the method to chemical-vapor-deposited graphene, we extract the complex conductivity, including Fermi level and scattering time. © 2014 OSA.

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Title: Extracting the complex optical conductivity of true twodimensional layers by ellipsometry
Translated title: Extracting the complex optical conductivity of true twodimensional layers by ellipsometry
Creators - without role: You-Chia Chang - University of Michigan
Chang-Hua Liu - University of Michigan
Zhaohui Zhong - University of Michigan
Theodore B. Norris - University of Michigan
Publication Details: Optics InfoBase Conference Papers
Identifiers: 9781557529992; 9781557529992; 9957769450506774
Academic Unit: Institute of Photonics Technologies, College of Electrical Engineering and Computer Science, National Tsing Hua University
Language: English
Resource Type: Conference paper

Extracting the complex optical conductivity of true twodimensional layers by ellipsometry

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