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FPGA-Based Emulation for Accelerating Transient Fault Reduction Analysis
會議論文

FPGA-Based Emulation for Accelerating Transient Fault Reduction Analysis

Zih-Ming Huang, Dun-An Yang, Jing-Jia Liou 和 Harry H. Chen
Proceedings - Asian Test Symposium, 卷.2022-, 頁碼.144-149
IEEE
2022 IEEE 31st Asian Test Symposium (ATS) (Taichung City, Taiwan, 21/11/2022–24/11/2022)
11/2022
Web of Science ID: WOS:000918526200025

摘要

Analytical models Archi-tecturally Correct Execution Circuit faults Emulation Fault Injection FPGA Hardware Integrated circuit modeling Reliability Soft Errors Transient analysis Transient Faults Software
There are several applications of functional simulation with transient faults including evaluation of the vulnerability and design error-tolerant measures, as well as debugging of electrical hardware issues. Yet, the simulation is extremely slow given the complexity of RTL circuits and a large number of transient faults proportional to the total execution cycles. Recently, fault reduction methods are developed with Architecturally Correct Execution (ACE) analysis. The method can identify only about 3 % of total faults deemed necessary for simulation. However, the analysis effort is still non-trivial and most of the time is consumed in the small single-cycle fault simulation. In this paper, we proposed to use FPGA emulation to speedup the above process. In the experiments, on a RISC- V core, for a set of 16K faults, the analysis time are reduced from 1 hours to 1min, On average, the fault emulation has a speed up factor of 60 compared with a software implementation.

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