- Title
- Failure-Pattern-Based Test Data Compression for Memories
- Creators - without role
- B.-Y. LinM. LeeC.-W. Wu
- Publication Details
- Proc. VLSI Test Technology Workshop (VTTW)
- Identifiers
- 9957771193906774
- Academic Unit
- College of Electrical Engineering and Computer Science, National Tsing Hua University
- Language
- Traditional Chinese
- Resource Type
- Conference paper
Conference paper
Failure-Pattern-Based Test Data Compression for Memories
Proc. VLSI Test Technology Workshop (VTTW)
07/2013
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