Logo image
Feasibility and Reliability of ENEPIG Surface Finish with Ultrathin Ni(P) Deposit in Microelectronic Packaging
Conference paper

Feasibility and Reliability of ENEPIG Surface Finish with Ultrathin Ni(P) Deposit in Microelectronic Packaging

C. Y. Ho and J. G. Duh
Doctoral Forum of Advanced Functional Materials and Cross-Strait Doctoral Forum 2012 Doctoral Forum of Advanced Functional Materials and Cross-Strait Doctoral Forum 2012
2012

Metrics

1 Record Views

Details

Logo image