Abstract
The MOCVD growth of InP/InGaAs PNP HBT layers and the successful fabrication and operation at high frequency of devices made on such layers are reported for the first time. The PNP HBTs employed a zinc-doped InP layer as emitter while the base was made with a 500Å thick n-type InGaAs layer doped at 5×l0 18 cm -3 . Microwave measurements indicated f T of more than 11 GHz at J c =8.25×10 4 A/cm 2 for these MOCVD-grown InP/InGaAs PNP HBTs.