M. Hong, J.N. Baillargeon, J. Kwo, J.P. Mannaerts and A.Y. Cho
IEEE International Symposium on Compound Semiconductors, Proceedings, pp.345-350
2000
Abstract
Using Ga 2 O 3 (Gd 2 O 3 ) as a gate dielectric and conventional ion implantation for source, drain, and isolation, we have fabricated and demonstrated a GaAs complementary metal-oxide-semiconductor field-effect-transistor (CMOS) inverter.