Flash memory built-in self-test with enhanced test mode control

Conference paper

Flash memory built-in self-test with enhanced test mode control

Y.-T. Lai, J.-C. Yeh, C.-W.Wu and C.-H. Ho

Proc. 15th VLSI Design/CAD Symp.

08/2004

Abstract

Flash memory;built-in self-test

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Title: Flash memory built-in self-test with enhanced test mode control
Creators - without role: Y.-T. Lai
J.-C. Yeh
C.-W.Wu
C.-H. Ho
Identifiers: 9957774911906774
Academic Unit: College of Electrical Engineering and Computer Science, National Tsing Hua University
Language: Traditional Chinese
Resource Type: Conference paper
Publication Details: Proc. 15th VLSI Design/CAD Symp.