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Forward light scattering method for structural characterization of electrospun fibers
Conference paper

Forward light scattering method for structural characterization of electrospun fibers

Wei-Chih Wang, Chao-Shih Liu, Zhi-Rong You and Jin-Jia Hu
Proceedings of SPIE - The International Society for Optical Engineering, Vol.8695, 869523
2013

Abstract

Electrospun fibers Fiber orientation Light scattering Nano fiber Electronic Optical and Magnetic Materials Condensed Matter Physics Computer Science Applications Applied Mathematics Electrical and Electronic Engineering
Electrospun fibers have been applied in numerous areas. In many of the applications, aligned fibers are desired for their specific properties. Recently, many different techniques have been developed to create aligned electrospun fibers. The direction of the fibers as well as the distribution of fiber orientations, in general, are analyzed by SEM which requires significant processing, thus increases time, and therefore costs. Currently we are examining these materials with forward light scattering in order to obtain fiber alignment and the distribution of fiber orientations. The proposed technique is slightly modified in the hardware and software from previous small angle scattering techniques to provide a more accurate and detailed mapping of the fibrous structure. © 2013 SPIE.

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