Abstract
The structure and composition of the ultra-thin film in a giant magnetoresistance (GMR) device were studied using a field emission gun TEM (FEG TEM) equipped with energy dispersive x-ray spectroscopy (EDS) and energy filter systems. Focus was on the sandwich structure of the CoFe/Cu/CoFe multilayers. By way of analysis, the change of the thickness of Cu film or another was determined. Based on this observation, the degradation of magnetoresistance in the sensor was followed.