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Highly charged ions in exotic atoms research at PSI
Conference paper

Highly charged ions in exotic atoms research at PSI

D.F. Anagnostopoulos, S. Biri, V. Boisbourdain, M. Demeter, G. Borchert, J.P. Egger, H. Fuhrmann, D. Gotta, A. Gruber, M. Hennebach, …
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Vol.205, pp.9-14
05/2003

Abstract

Crystal spectroscopy ECR Exotic atoms Pion mass Pionic hydrogen Surfaces Coatings and Films Instrumentation Surfaces and Interfaces
During their de-excitation, exotic atoms formed in low pressure gases reach a state of high or even complete ionization. X-rays emitted from higher n-states of electron-free atoms have well defined energies with the error originating only from the error in the mass values of the constituent particles. They served as a basis for a new determination of the pion mass as well as for a high precision measurement of the pionic hydrogen ground state shift. The response function of the Bragg spectrometer has been determined with X-rays from completely ionized pionic carbon and with a dedicated electron cyclotron resonance ion trap (ECRIT). A further extension of the ECRIT method implemented in the experiment allows a direct calibration of exotic atom transitions as well as a precise determination of the energy of fluorescence lines. © 2003 Elsevier Science B.V. All rights reserved.

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