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INVESTIGATION OF COPPER INTERCONNECTS SUFFERED RELIABILITY PHYSICS FOR ADVANCED PACKAGING ARCHITECTURE
Conference paper

INVESTIGATION OF COPPER INTERCONNECTS SUFFERED RELIABILITY PHYSICS FOR ADVANCED PACKAGING ARCHITECTURE

J.-C. Chuang and 昌駿 李
ASME International Mechanical Engineering Congress and Exposition, Proceedings (IMECE), Vol.10
2024

Abstract

Advanced Packaging;Copper interconnection;Electromigration (EM)

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