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Improved the Electrical Reliability of a-Si:H TFTs on Flexible Substrates with Saturation in Deep State
Conference paper

Improved the Electrical Reliability of a-Si:H TFTs on Flexible Substrates with Saturation in Deep State

M. H. Lee, T. H. Wu, S. T. Chang and C. C. Lee
9th International Nanotech Symposium & Exhibition (NANO KOREA 2011) 9th International Nanotech Symposium & Exhibition (NANO KOREA 2011)
2011

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