Improving the Efficiency of Scan Test on Wireless HOY Test Platform

Conference paper

C.-W. Tzeng, C.-Y. Lin, S.-Y. Huang, C.-T. Huang, J.-J. Liou, H.-P. Ma and C.-W. Wu

2008 IEEE International Test Synthesis Workshop - ITSW

2008

Abstract

Scan Test;Wireless;HOY

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Title: Improving the Efficiency of Scan Test on Wireless HOY Test Platform
Creators - without role: C.-W. Tzeng
C.-Y. Lin
S.-Y. Huang
C.-T. Huang
J.-J. Liou - 國立清華大學電機資訊學院電機工程學系
H.-P. Ma
C.-W. Wu
Identifiers: 9957768594506774
Academic Unit: Department of Electrical Engineering, College of Electrical Engineering and Computer Science, National Tsing Hua University
Language: Traditional Chinese
Resource Type: Conference paper
Publication Details: 2008 IEEE International Test Synthesis Workshop - ITSW