In-situ Atomic Force Microscopy Study of the Corrosion Behavior of NiTi Thin Film

Conference paper

K.T. Liu and J.G. Duh

2006 International Society of Electrochemistry 4th Spring Meeting 2006 International Society of Electrochemistry 4th Spring Meeting

2006

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Title: In-situ Atomic Force Microscopy Study of the Corrosion Behavior of NiTi Thin Film
Creators - without role: K.T. Liu
J.G. Duh - 國立清華大學工學院材料科學工程學系
Publication Details: 2006 International Society of Electrochemistry 4th Spring Meeting 2006 International Society of Electrochemistry 4th Spring Meeting
Identifiers: 9957776431906774
Academic Unit: National Tsing Hua University
Language: Traditional Chinese
Resource Type: Conference paper