- Title
- In-situ TEM study of atomic-scale microstructural evolution in Cu under electric current stressing
- Creators - without role
- C. N. Liao - 國立清華大學工學院材料科學工程學系
- Publication Details
- IUMRS International Conference in Asia (IUMRS-ICA)
- Identifiers
- 9957767055106774
- Academic Unit
- Department of Materials Science and Engineering, College of Engineering, National Tsing Hua University
- Language
- Traditional Chinese
- Resource Type
- Conference paper
Conference paper
In-situ TEM study of atomic-scale microstructural evolution in Cu under electric current stressing
IUMRS International Conference in Asia (IUMRS-ICA)
2011
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