- Title
- Intelligent Similarity Matching of Wafer Bin Maps
- Creators - without role
- Chen-Fu Chien - 國立清華大學工學院工業工程與工程管理學系C.-Y. HsuW.-J. Chen
- Publication Details
- Proceedings of the 9th annual IEEE International Conference on Automation Science and Engineering (IEEE CASE 2013) Proceedings of the 9th annual IEEE International Conference on Automation Science and Engineering (IEEE CASE 2013)
- Identifiers
- 9957767435306774
- Academic Unit
- Department of Industrial Engineering and Engineering Management, College of Engineering, National Tsing Hua University
- Language
- Traditional Chinese
- Resource Type
- Conference paper
Conference paper
Intelligent Similarity Matching of Wafer Bin Maps
Proceedings of the 9th annual IEEE International Conference on Automation Science and Engineering (IEEE CASE 2013) Proceedings of the 9th annual IEEE International Conference on Automation Science and Engineering (IEEE CASE 2013)
2013
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