- Title
- Interface quality in InP/InGaAs RTDs and 2DEG in delta-doped HFET channels as observed by scanning tunneling microscopy
- Creators - without role
- W. WuS. L. SkalaJ. R. TuckerK. Y. ChengJ. W. Lyding
- Publication Details
- American Vacuum Society 41st National Symposium
- Identifiers
- 9957777543606774
- Academic Unit
- National Tsing Hua University
- Language
- Traditional Chinese
- Resource Type
- Conference paper
Conference paper
Interface quality in InP/InGaAs RTDs and 2DEG in delta-doped HFET channels as observed by scanning tunneling microscopy
American Vacuum Society 41st National Symposium
1994
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