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Investigation of Breakdown Voltage Characteristics of InGaAs/InAlAs Single Photon Avalanche Diodes
Conference paper

Investigation of Breakdown Voltage Characteristics of InGaAs/InAlAs Single Photon Avalanche Diodes

Shih-Cheng Chang and Yi-Shan Lee
OECC/PSC 2019 - 24th OptoElectronics and Communications Conference/International Conference Photonics in Switching and Computing 2019, 8817680
07/2019

Abstract

Photodetectors Computer Networks and Communications Signal Processing Electrical and Electronic Engineering Instrumentation Atomic and Molecular Physics and Optics
We present a temperature dependence study of InGaAs/InAlAs single photon avalanche diode. The breakdown voltage as a function of temperature exhibits two slope behavior. The temperature coefficient is sensitive to the avalanche region. We have excluded the issue of imperfect sidewall. However, the physics behind needs further investigation.

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