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Investigation of Thermal Effect of Packaged CMOS Compatible Pressure Sensor
Conference paper

Investigation of Thermal Effect of Packaged CMOS Compatible Pressure Sensor

Chih-Tang Peng, Ji-Cheng Lin, Chun-Te Lin and Kuo-Ning Chiang
American Society of Mechanical Engineers, Manufacturing Engineering Division, MED, Vol.13, pp.505-512
2002

Abstract

Finite element method (FEM) Piezoresistive pressure sensor
In this study, a packaged silicon base piezoresistive pressure sensor with thermal stress buffer is designed, fabricated, and measured. A finite element method (FEM) is adopted for design and experimental validation of the sensor performance. Thermal and pressure loading on the sensor is applied to make a comparison between sensor experimental and simulation results. Furthermore, a method that transfers simulation stress data into output voltage is proposed in this study, the results indicate that the experimental result coincides with simulation data.

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