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Investigation of local structures around Mn atoms in In1-xMnxAs diluted magnetic semiconductors using EXAFS
Conference paper   Peer reviewed

Investigation of local structures around Mn atoms in In1-xMnxAs diluted magnetic semiconductors using EXAFS

Y.L. Soo, S.W. Huang, Z.H. Ming, Y.H. Kao, H. Munekata and L.I. Chang
Materials Research Society Symposium - Proceedings, Vol.375, pp.27-32
1995

Abstract

Extended x-ray absorption fine structure (EXAFS) techniques have been used to investigate the local structures in In 1-X Mn X As films grown by molecular beam epitaxy (MBE) under different processing conditions. For samples grown at low substrate temperatures (near 200°C) or with a low Mn concentration (about 1 atomic %), the Mn atoms can substitute for In in the InAs host, thus indicating that III-V diluted magnetic semiconductors (DMS) can indeed be prepared by substitutional doping of magnetic impurities. On the other hand, substitution dose not take place in high Mn concentration (above 10%) samples grown at high substrate temperatures (around 300°C); these samples contain a large amount of MnAs clusters and become ferromagnetic.

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