Logo image
Investigation of voltage-dependent thermal property in high-voltage drain-extended MOSFETs
Conference paper

Investigation of voltage-dependent thermal property in high-voltage drain-extended MOSFETs

Chen-Liang Chu, C.M. Hu, C.F. Huang, Y.S. Chen, F.Y. Chen, K.B. Thei, C.C. Hsu, C.W. Yao, R.S. Liou and H.C. Tuan
Proceedings of the International Symposium on Power Semiconductor Devices and ICs, pp.117-119
2012

Abstract

DEMOSFET thermal property voltage-dependent
In this study, a reduction in the saturation current caused by self-heating effect at high V GS is observed in a 35-V rated asymmetric DEMOSFET. The high V GS -induced the large current and raises up the device surface temperature. The Kirk-effect takes places at sufficiently high current levels (high V GS values) leading to the movement of the maximum temperature point from the gate-overlapped DE (drain-extended) region to the drain-side contact region. The drift-region resistance strongly correlates to the self-heating effect and the V K voltage is proportional to the doping concentration in the drift region. As a result, the reduced surface heating (RESURH) can be realized by the optimization of doping concentration in the drift region. © 2012 IEEE.

Metrics

1 Record Views

Details

Logo image