Abstract
The practical approach to implement a 1 ω current probe with verification for measuring the IC conducted emission is proposed. The 1 ω/150 ω direct coupling method is reviewed and the considerations on improving the applicable bandwidth of 1 ω method are discussed. The critical component, 1 ω resistor which dominates the frequency response, is designed. The realized 1 ω probe was fully certified with the specification in the IEC 61967-4 standard. The experimental results show the applicable bandwidth of the 1 ω could cover 1 GHz with accuracy and confidence.