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Layout Design Effect of Transverse Dummy Polys on Stress-Induced Performance of Ge-Based High-k/Metal Gate NMOSFETs
Conference paper

Layout Design Effect of Transverse Dummy Polys on Stress-Induced Performance of Ge-Based High-k/Metal Gate NMOSFETs

C. C. Lee and P. C. Huang
TACT 2017 International Thin Films Conference TACT 2017 International Thin Films Conference
2017

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