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Layout Effect of Polysilicon Wall Embedded in Shallow Trench Isolation Region on the Performance of High-k/Metal Gate PMOSFETs
Conference paper

Layout Effect of Polysilicon Wall Embedded in Shallow Trench Isolation Region on the Performance of High-k/Metal Gate PMOSFETs

C. C. Lee and P. C. Huang
16th International Nanotech Symposium & Exhibition (NANO KOREA 2018) 16th International Nanotech Symposium & Exhibition (NANO KOREA 2018)
2018

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