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Layout Hotspot Pattern Clustering Using a Density-based Approach
Conference paper

Layout Hotspot Pattern Clustering Using a Density-based Approach

Ciao-Syun Lin, Pin-Yian Tsai, Yan-Hsiu Liu, Yi-Ting Li, Yung-Chih Chen and Chun-Yao Wang
2023 International VLSI Symposium on Technology, Systems and Applications, VLSI-TSA/VLSI-DAT 2023 - Proceedings
2023

Abstract

Artificial Intelligence Computer Networks and Communications Computer Science Applications Hardware and Architecture Information Systems Electrical and Electronic Engineering
Since the number of hotspot patterns detected on a layout using machine learning technique is very large, it takes designers a lot of time to classify these hotspot patterns for subsequent modification. These hotspot patterns are diverse and complex in shape. Therefore, we propose a density-based hotspot pattern clustering approach to classify these hotspot patterns into groups, which extracts the density feature of hotspot patterns while considering the shifted and distorted polygons on hotspot patterns. Experimental results show that our approach can classify the hotspot patterns more efficiently than SIFT method with similar results in each group.

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