Logistics Efficiency Improvement with Lean Management and RFID Application

Conference paper

J. C. Chen, K. J. Wang, C. H. Cheng, Y. J. Fang, C. J. Sun and J. W. Chien

3rd International Conference on Advanced Design and Manufacture 3rd International Conference on Advanced Design and Manufacture

2010

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Title: Logistics Efficiency Improvement with Lean Management and RFID Application
Creators - without role: J. C. Chen - 國立清華大學工學院工業工程與工程管理學系
K. J. Wang
C. H. Cheng
Y. J. Fang
C. J. Sun
J. W. Chien
Identifiers: 9957770826006774
Academic Unit: Department of Industrial Engineering and Engineering Management (Professional Master Program), National Tsing Hua University
Language: Traditional Chinese
Resource Type: Conference paper
Publication Details: 3rd International Conference on Advanced Design and Manufacture 3rd International Conference on Advanced Design and Manufacture