Logo image
Low noise ALGaN/GaN MODFETs with high breakdown and power characteristics
Conference paper

Low noise ALGaN/GaN MODFETs with high breakdown and power characteristics

S.S.H. Hsu, D. Pavlidis, J.S. Moon, M. Micovic, C. Nguyen and D. Grider
Technical Digest - GaAs IC Symposium (Gallium Arsenide Integrated Circuit), pp.229-232
2001

Abstract

Evaluation of AlGaN/GaN MODFET with low noise, high breakdown and power characteristics was done. A noise figure of 1.9 dB with associated gain of 16.2 dB was obtained at a quiescent point of V DS = 10 and I DS = 30 mA at 10 GHz. Investigation of a MODFET noise model and its correlation with gate leakage current was also done.

Metrics

1 Record Views

Details

Logo image