Manipulation of carbon nanotubes (CNTs) profile by pre-annealed Ni/Ti/Si substrate

H.C. Peng; C.C. Chieng; C.H. Tsai; F.G. Tseng

doi:10.1109/NEMS.2008.4484448

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Conference paper

Manipulation of carbon nanotubes (CNTs) profile by pre-annealed Ni/Ti/Si substrate

H.C. Peng, C.C. Chieng, C.H. Tsai and F.G. Tseng

3rd IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS, pp.812-815

2008

DOI: https://doi.org/10.1109/NEMS.2008.4484448

Abstract

Carbon nanotubes (CNTs)

Cyclic voltammetry (CV)

Nickel (Ni)

Thermal CVD

Titanic (Ti)

Well aligned CNTs on Ni/Ti/Si substrate were presented in this paper by the employment of pre-annealing process to the adhesive layer(Ti). SEM images show both the alignment and uniformity of the CNTs on pre-annealed substrates are better than that on non-treated substrate. The wall structures of the CNTs were also characterized and demonstrated different organizations. By this pre-annealing process, better current density could be achieved for the wellaligned CNTs from cyclic voltammetry test.. © 2008 IEEE.

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Title: Manipulation of carbon nanotubes (CNTs) profile by pre-annealed Ni/Ti/Si substrate
Creators - without role: H.C. Peng - National Tsing Hua University
C.C. Chieng - National Tsing Hua University
C.H. Tsai - National Tsing Hua University
F.G. Tseng - Academia Sinica
Identifiers: 9781424419081; 9957767635206774
Academic Unit: Department of Engineering and System Science, College of Nuclear Science, National Tsing Hua University
Language: English
Resource Type: Conference paper
Publication Details: 3rd IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS, pp.812-815

Manipulation of carbon nanotubes (CNTs) profile by pre-annealed Ni/Ti/Si substrate

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