Measurement of Photo-Carrier Lifetime of Low-Temperature-Grown GaAs by Well-Above-Bandgap Pump-Probe Photoreflectance and Transmittance

Conference paper

Sheng-fu Horng, Jian-Shen Yu, P. Y. Guei, T. R. Tsai and C. C. Chi

The Science and Technology Seminar on Femtosecond Technology, Tokyo, Japan, Feb. 9-10, 1998

1998

Abstract

Low-Temperature-Grown;GaAs;Well-Above-Bandgap;Pump-Probe;Photoreflectance

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Title: Measurement of Photo-Carrier Lifetime of Low-Temperature-Grown GaAs by Well-Above-Bandgap Pump-Probe Photoreflectance and Transmittance
Creators - without role: Sheng-fu Horng - 國立清華大學電機資訊學院電機工程學系
Jian-Shen Yu
P. Y. Guei
T. R. Tsai
C. C. Chi
Identifiers: 9957775497906774
Academic Unit: Institute of Electronics Engineering, College of Electrical Engineering and Computer Science, National Tsing Hua University
Language: Traditional Chinese
Resource Type: Conference paper
Publication Details: The Science and Technology Seminar on Femtosecond Technology, Tokyo, Japan, Feb. 9-10, 1998