Measurement of dielectric constant in extended-nano spaces by using ac impedance measurement

K. Imai; K. Mawatari; K. Morikawa; T. Kitamori

Back

Conference paper

Measurement of dielectric constant in extended-nano spaces by using ac impedance measurement

K. Imai, K. Mawatari, K. Morikawa and T. Kitamori

20th International Conference on Miniaturized Systems for Chemistry and Life Sciences, MicroTAS 2016, pp.770-771

2016

Appears in keyword about Chemistry

Abstract

Dielectric constant;Extended-nano space;Impedance;Solution chemistry

Control and Systems Engineering

We developed a measurement method of dielectric constant of water in 10-100 nm spaces (extended-nano spaces) by top-down and bottom-up fabrication process. The alternate current (AC) impedance signal of water and its capacitance was successfully obtained. This study provides important information for device engineering in nanofluidics.

Metrics

1 Record Views

Details

Title: Measurement of dielectric constant in extended-nano spaces by using ac impedance measurement
Translated title: Measurement of dielectric constant in extended-nano spaces by using ac impedance measurement
Creators - without role: K. Imai - The University of Tokyo
K. Mawatari - The University of Tokyo
K. Morikawa - The University of Tokyo
T. Kitamori - The University of Tokyo
Publication Details: 20th International Conference on Miniaturized Systems for Chemistry and Life Sciences, MicroTAS 2016, pp.770-771
Identifiers: 9780979806490; 9957773132906774
Academic Unit: Institute of NanoEngineering and Microsystems, College of Engineering, National Tsing Hua University; Department of Power Mechanical Engineering, College of Engineering, National Tsing Hua University
Language: English
Resource Type: Conference paper

Measurement of dielectric constant in extended-nano spaces by using ac impedance measurement

Abstract

Related links

Metrics

Details

National Tsing Hua University Social media