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Measurement of warpage of electronic packagings after machining by phase-shifting shadow moiré method
Conference paper

Measurement of warpage of electronic packagings after machining by phase-shifting shadow moiré method

Wei-Chung Wang and Yu-Wen Liu
Proceedings of SPIE - The International Society for Optical Engineering, Vol.4537, pp.20-24
2001

Abstract

Electronic packaging Phase-shifting Shadow moiré method Thermal cycle Warpage
In this paper, phase-shifting shadow moiré method was employed to investigate the machining effect on the warpage of electronic packagings undergone thermal cycles. Four types of machined slots were tested and compared with the unmachined one. It was found that they all give significant improvement on the warpage. However, the crossed type slot gives the largest reduction of warpage.

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