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Mechanical Behavior Investigation of Creep and Warpage for Thin-Type Three-Dimensional Integrated Circuits Packaging Structures
Conference paper

Mechanical Behavior Investigation of Creep and Warpage for Thin-Type Three-Dimensional Integrated Circuits Packaging Structures

C. C. Lee, Y. H. Guo and H. C. Liu
Proceedings of the 32th National Conference on Mechanical Engineering (CSME) Proceedings of the 32th National Conference on Mechanical Engineering (CSME)
2015

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