Logo image
Mechanical deformation-induced Sn whisker formation and microstructure development in electroplated films
Conference paper

Mechanical deformation-induced Sn whisker formation and microstructure development in electroplated films

S.-K. Lin, Y. Yorikado, K.-S. Kim, K. Suganuma, S.-W. Chen, M. Tsujimoto and I. Yanada
The 2007 136th TMS Annual Meeting & Exhibition, Technical Division Student Poster Contest The 2007 136th TMS Annual Meeting & Exhibition, Technical Division Student Poster Contest
2007

Abstract

Mechanical deformation-induced;Sn whisker formation;microstructure development;electroplated films

Metrics

1 Record Views

Details

Logo image