Abstract
Thin-film transistor (TFT) circuits are facing the challenges of unipolar device, process variation, and yield problems, which can be addressed by pseudo-CMOS logic array with multi-layer interconnect. However, existing design methodology does not take mechanical strain and temperature into consideration which may seriously affect the carrier mobility of TFT and thus the performance of whole logic array circuits. This paper presents a novel cell mapping algorithm including intrarow mapping step and inter-row mapping step for flexible logic array to mitigate the mobility influence. Experimental results indicate that there is more than 40% performance improvement in critical path delay at best case with the proposed algorithm.