Memory Effects of MoSi2 Nanocrystals in Oxide Dielectrics

Conference paper

J. Y. Lin, C. C. Yu, S. C. Chen, T. C. Chang and W. F. Wu

Symposium on Nano Device Technology Symposium on Nano Device Technology

2011

Abstract

Memory Effects;MoSi2 Nanocrystals;Oxide Dielectrics

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Title: Memory Effects of MoSi2 Nanocrystals in Oxide Dielectrics
Creators - without role: J. Y. Lin
C. C. Yu
S. C. Chen
T. C. Chang
W. F. Wu - 國立清華大學原子科學院工程與系統科學系
Identifiers: 9957777362606774
Academic Unit: Department of Engineering and System Science, College of Nuclear Science, National Tsing Hua University
Language: Traditional Chinese
Resource Type: Conference paper
Publication Details: Symposium on Nano Device Technology Symposium on Nano Device Technology