Abstract
The biquadratic coupling in Fe/Si multilayers (MLs) has been proposed to explain the temperature dependence of interlayer coupling strength. In this article, a thin Al layer (0.2 nm) was inserted between Fe and Si to modify the interface characteristics. The temperature dependence of interlayer coupling and magnetoresistance (MR) of Fe/Si and Fe/Si/Al MLs are discussed. We observe that the strength of biquadratic coupling can be correlated to the discrepancy of the saturation field H s between M-H loops and MR loops.