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Monolayer MoS2 for nonvolatile memory applications
Conference paper

Monolayer MoS2 for nonvolatile memory applications

Kai-Ping Chang, Jer-Chyi Wang, Chang-Hsiao Chen, Lain-Jong Li and Chao-Sung Lai
2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2016 - Proceedings, pp.489-491
07/2017

Abstract

Electrical and Electronic Engineering Safety Risk Reliability and Quality Electronic Optical and Magnetic Materials
In this work, two-dimensional MoS2 has been performed for nonvolatile memory application as charge storage layer. The capacitance-voltage (C-V) hysteresis and programming characteristics of MoS2-NVMs with blocking oxide layer of various thicknesses have been further investigated. The MoS2-NVMs with 9-nm-thck blocking oxide layer exhibits a large hysteresis in the C-V sweeping and the fastest speed in programming characteristics. In addition, both electrons and holes can store in MoS2 monolayer, contributing to a promising application in future high-performance NVMs.

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