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Multi-Scale Patch-Based Representation Learning for Image Anomaly Detection and Segmentation
Conference paper

Multi-Scale Patch-Based Representation Learning for Image Anomaly Detection and Segmentation

Chin-Chia Tsai, Tsung-Hsuan Wu and Shang-Hong Lai
Proceedings - 2022 IEEE/CVF Winter Conference on Applications of Computer Vision, WACV 2022, pp.3065-3073
2022

Abstract

Few-shot Industrial Inspection Transfer Semi- and Un- supervised Learning Computer Vision and Pattern Recognition Computer Science Applications
Unsupervised representation learning has been proven to be effective for the challenging anomaly detection and segmentation tasks. In this paper, we propose a multi-scale patch-based representation learning method to extract critical and representative information from normal images. By taking the relative feature similarity between patches of different local distances into account, we can achieve better representation learning. Moreover, we propose a refined way to improve the self-supervised learning strategy, thus allowing our model to learn better geometric relationship between neighboring patches. Through sliding patches of different scales all over an image, our model extracts representative features from each patch and compares them with those in the training set of normal images to detect the anomalous regions. Our experimental results on MVTec AD dataset and BTAD dataset demonstrate the proposed method achieves the state-of-the-art accuracy for both anomaly detection and segmentation.

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