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Multiple error diagnosis in large combinational circuits using an efficient parallel vector simulation
Conference paper

Multiple error diagnosis in large combinational circuits using an efficient parallel vector simulation

Yu-Lin Hsiao, Chun-Yao Wang and Yung-Chih Chen
2008 International Symposium on VLSI Design, Automation, and Test, VLSI-DAT, pp.109-112
2008

Abstract

This paper presents a parallel vector simulation-based approach to locating multiple errors in large combinational circuits. Two heuristics are proposed to avoid the explosion of the error space. Experimental results on a set of ISCAS'85 and two large benchmarks show that our approach efficiently identifies a small set of correctable nodes that contains the actual error sources. Thus, further error correction can be conducted on the erroneous implementation. ©2008 IEEE.

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