- Title
- Neighborhood pattern-sensitive fault testing for semiconductor memories
- Creators - without role
- K.-L. ChengC.-W. Wu
- Publication Details
- Proc. 11th VLSI Design/CAD Symp., pp.401-404
- Identifiers
- 9957775000906774
- Academic Unit
- College of Electrical Engineering and Computer Science, National Tsing Hua University
- Language
- Traditional Chinese
- Resource Type
- Conference paper
Conference paper
Neighborhood pattern-sensitive fault testing for semiconductor memories
Proc. 11th VLSI Design/CAD Symp., pp.401-404
08/2000
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