Logo image
Non-exhaustive clustering for overlapping patent clusters analysis
Conference paper

Non-exhaustive clustering for overlapping patent clusters analysis

A.J.C. Trappey, Y.S. Huang and C.Y. Wu
8th Asia-Pacific Conference on Industrial Engineering and Management Systems 8th Asia-Pacific Conference on Industrial Engineering and Management Systems
2007

Abstract

patent clusters

Metrics

1 Record Views

Details

Logo image