Abstract
Atomic density profile of selected atomic species in a series of CdS/Zn2SnO4 junctions has been investigated by using the method of Angular Dependence of X-ray Fluorescence (ADXRF). Samples of CdS, Zn2SnO4 (ZTO), and CdS/ZTO junctions were grown on glass, followed by different annealing processes. Special attention is directed to a comparison of samples heat-treated in argon and in CdCl2 at different temperatures. It has been found that different heat treatment conditions can result in drastic variations in the density distribution of the constituents in the system.