Nondestructive sub-micron scale analysis of compositional distribution in Cu(InxGa1-x)Se2 absorbers by field emission EPMA

Conference paper

Tzu-Ying Lin, Chia-Hsiang Chen and Chib-Huang Lai

The 2016 E-MRS Spring Meeting

05/2016

Abstract

sub-micron scale;EPMA

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Title: Nondestructive sub-micron scale analysis of compositional distribution in Cu(InxGa1-x)Se2 absorbers by field emission EPMA
Creators - without role: Tzu-Ying Lin
Chia-Hsiang Chen
Chib-Huang Lai
Identifiers: 9957769650806774
Academic Unit: Department of Materials Science and Engineering, College of Engineering, National Tsing Hua University
Language: English
Resource Type: Conference paper
Publication Details: The 2016 E-MRS Spring Meeting