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Novel in-lane gap closing CMOS-MEMS microphone with no back-late
Conference paper

Novel in-lane gap closing CMOS-MEMS microphone with no back-late

Chun-I Chang, Sung-Cheng Lo, Chuanwei Wang, Yi-Chiang Sun and Weileun Fang
Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS), pp.136-139
2014

Abstract

The stacking of metal/tungsten layers as the sensing electrodes for CMOS-MEMS microphone without the back-late has been proposed and demonstrated for the first time. The acoustic pressure will deform the spring-diaphragm structure and further cause the in-lane gap-closing between sensing electrodes. Thus, acoustic pressure and dynamic response of spring-suspension can be determined by the sensing capacitance changes. Such design has the following merits: (1) no back-late is required, (2) bias voltage to pull diaphragm close to back-late is not required, (3) in-use pull-in and process stiction between diaphragm and back-late is also prevented, (4) easy integration with sensing circuits. The design was implemented using the standard TSMC CMOS process. Typical microphone with 200μm-diameter diaphragm and 48-airs sensing electrodes has been realized. Measurements show the sensitivity of microphone is-64.78dBV/Pa at 1kHz. © 2014 IEEE.

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