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Observation of liquid/liquid interface by atomic force microscopy
Conference paper

Observation of liquid/liquid interface by atomic force microscopy

C.Y. Yang, Fu Han Ho and J. Andrew Yeh
TRANSDUCERS 2009 - 15th International Conference on Solid-State Sensors, Actuators and Microsystems, pp.2050-2053
2009

Abstract

Atomic force microscopy Liquid/liquid interfaces Hardware and Architecture Electrical and Electronic Engineering
This research successfully measure the topography of liquid-liquid interface by using atomic force microscopy (AFM). In this paper, tapping mode AFM in liquid was used to directly probe the glycerol surface and sketch the topography of glycerol droplet in the silicone oil with respect to study the properties of liquid/liquid interfaces. In addition, to study the surface properties of liquid/liquid interface, the dependence of interfacial roughness on different viscosities was investigated as well. The roughness of liquid-liquid interface is low enough in the experimental results. Furthermore, as for the high resolution and convenience of AFM, the molecular structure of liquid might be investigated in the future. ©2009 IEEE.

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