- Title
- Observation on electromigration induced nanoscale lamellar microstructure change in eutectic SnPb flip chip solder joints
- Creators - without role
- Hao HsuFan-Yi Ouyang - 國立清華大學原子科學院工程與系統科學系
- Publication Details
- AMD fusion 7th Annual Technical Forum & Exhibition AMD fusion 7th Annual Technical Forum & Exhibition
- Identifiers
- 9957766886806774
- Academic Unit
- Institute of Nuclear Engineering and Science, College of Nuclear Science, National Tsing Hua University
- Language
- Traditional Chinese
- Resource Type
- Conference paper
Conference paper
Observation on electromigration induced nanoscale lamellar microstructure change in eutectic SnPb flip chip solder joints
AMD fusion 7th Annual Technical Forum & Exhibition AMD fusion 7th Annual Technical Forum & Exhibition
2011
Related links
Metrics
1 Record Views