Opportunities with the open architecture test system

Conference paper

K. Hatayama, R. Rajsuman, C.-W. Wu, Y. Nishimura, S. Chakradhar, A. Merschon, D. Petrich and T. Tada

Proceeding - IEEE Asia and South Pacific Design Automation Conf. (ASP-DAC), pp.334-334

12/2003

Abstract

open architecture;test system

electrical engineering

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Title: Opportunities with the open architecture test system
Creators - without role: K. Hatayama
R. Rajsuman
C.-W. Wu
Y. Nishimura
S. Chakradhar
A. Merschon
D. Petrich
T. Tada
Publication Details: Proceeding - IEEE Asia and South Pacific Design Automation Conf. (ASP-DAC), pp.334-334
Identifiers: 9957775935706774
Academic Unit: College of Electrical Engineering and Computer Science, National Tsing Hua University
Language: Traditional Chinese
Resource Type: Conference paper